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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Repositories
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2019臺灣學術機構典藏
研討會
機構典藏系統RC7版本已
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Institution Date Title Author
臺大學術典藏 2022-05-24T06:26:51Z New nano-contouring measurement techniques for a nano-stage Jywe W.-Y.;Teng Y.-F.; Jywe W.-Y.; Teng Y.-F.; Wen-Yuh Jywe
臺大學術典藏 2022-05-24T06:26:51Z New nano-contouring measurement techniques for a nano-stage Jywe W.-Y.;Teng Y.-F.; Jywe W.-Y.; Teng Y.-F.; Wen-Yuh Jywe
臺大學術典藏 2022-05-24T06:26:50Z A novel simple and low cost 4-DOF angular indexing calibrating techniques for high precision rotary table Chen C.-J.;Jywe W.;Teng Y.-F.;Liu C.-H.; Chen C.-J.; Jywe W.; Teng Y.-F.; Liu C.-H.; Wen-Yuh Jywe
臺大學術典藏 2022-05-24T06:26:50Z A novel simple and low cost 4-DOF angular indexing calibrating techniques for high precision rotary table Chen C.-J.;Jywe W.;Teng Y.-F.;Liu C.-H.; Chen C.-J.; Jywe W.; Teng Y.-F.; Liu C.-H.; Wen-Yuh Jywe
臺大學術典藏 2022-05-24T06:26:49Z Development of a laser based dual-axial five-degrees-of-freedom measurement system for an X-Y stag Jywe W.-Y.;Liu C.-H.;Teng Y.-F.;Chen C.-J.;Shen J.-C.;Hsieh W.-H.;Wang Y.-C.; Jywe W.-Y.; Liu C.-H.; Teng Y.-F.; Chen C.-J.; Shen J.-C.; Hsieh W.-H.; Wang Y.-C.; Wen-Yuh Jywe
臺大學術典藏 2022-05-24T06:26:49Z Development of a laser based dual-axial five-degrees-of-freedom measurement system for an X-Y stag Jywe W.-Y.;Liu C.-H.;Teng Y.-F.;Chen C.-J.;Shen J.-C.;Hsieh W.-H.;Wang Y.-C.; Jywe W.-Y.; Liu C.-H.; Teng Y.-F.; Chen C.-J.; Shen J.-C.; Hsieh W.-H.; Wang Y.-C.; Wen-Yuh Jywe
臺大學術典藏 2022-05-24T06:26:48Z Development of a flexure hinge-based stack-type five-degrees-of-freedom nanometre-scale stage for a heavy-loading machining process Jywe W.;Liu C.-H.;Teng Y.-F.; Jywe W.; Liu C.-H.; Teng Y.-F.; Wen-Yuh Jywe
臺大學術典藏 2022-05-24T06:26:48Z Development of a flexure hinge-based stack-type five-degrees-of-freedom nanometre-scale stage for a heavy-loading machining process Jywe W.;Liu C.-H.;Teng Y.-F.; Jywe W.; Liu C.-H.; Teng Y.-F.; Wen-Yuh Jywe
臺大學術典藏 2022-05-24T06:26:46Z Development of the nano-measuring machine stage Jywe W.-Y.;Jeng Y.-R.;Teng Y.-F.;Wang H.-S.;Wu C.-H.; Jywe W.-Y.; Jeng Y.-R.; Teng Y.-F.; Wang H.-S.; Wu C.-H.; Wen-Yuh Jywe
臺大學術典藏 2022-05-24T06:26:46Z Development of the nano-measuring machine stage Jywe W.-Y.;Jeng Y.-R.;Teng Y.-F.;Wang H.-S.;Wu C.-H.; Jywe W.-Y.; Jeng Y.-R.; Teng Y.-F.; Wang H.-S.; Wu C.-H.; Wen-Yuh Jywe

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